français | english		EPFL > people@EPFL > Sebastian Gautsch login

Scientist STI IMT SAMLAB

Sebastian Gautsch Sensors, Actuators and Microsystems Laboratory Dr. birth date: 13.10.1975 nationality: Suisse web site: http://samlab.epfl.ch/Nanotools office(s): ELB111 JD11O12 phone(s): [+41 21 69] 31058,0327205515 fax: 032 720 57 11 BIOGRAPHY Sebastian Gautsch received his M.A.Sc. degree in Electronical physics from the University of Neuchâtel, Switzerland in 1998. He obtained his Ph.D. degree in the field of micro-mechanical systems from the Institute of Microtechnology (IMT), University of Neuchâtel, Switzerland in 2001. His PHD thesis has been done in collaboration with the Jet Propulsion Laborytory (JPL) in Pasadena and led to the successful operation of an Atomic Force Microscope on the Phoenix mission to Mars in 2008. He is currently a team leader at EPFL IMT SAMLAB in the field of Tools for Nanoscience and in charge of the coordination of internships for master students at the school of Engineering of EPFL. MAIN PUBLICATIONS S. Gautsch, M. Studer, and N. F. de Rooij. Complex nanostructures in PMMA made by a single process step using e-beam lithography. Journal of Microelectronic Engineering, 87:1139-1142, 2010. [ DOI | Details | Link ] H. Weigand, S. Gautsch, W. Strohmaier, M. Fleischer, U. Staufer, N. de Rooij, and D. Kern. Microcolumn design for a large scan field and pixel number. Journal of Vacuum Science & Technology B, 27:2542-2546, 2009. [ DOI | Details | Link ] S. Gautsch. Nano-images from Mars. Smart Textiles and Nanotechnology, (9):9, 2008. [ DOI | Details | Full Text ] S. Gautsch. La part infime de mars. En Direct, Journal de la Recherche et du Transfert de l’Arc Jurassien, 221:18-19, 2008. [ DOI | Details | Full Text ] S. Gautsch. Fine images of Martian Dust. Nano Magazine, 8:15-17, 2008. [ DOI | Details | Full Text ] M. Hecht, J. Marshall, W. Pike, U. Staufer, D. Blaney, D. Braendlin, S. Gautsch, W. Goetz, H. Hidber, H. Keller, W. Markiewicz, A. Mazer, T. Meloy, J. Morookian, C. Mogensen, D. Parrat, P. Smith, H. Sykulska, R. Tanner, R. Reynolds, A. Tonin, S. Vijendran, M. Weilert, and P. Woida. Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer. Journal of Geophysical Research, 113(E00A22):1-28, 2008. [ DOI | Details ] S. Gautsch, N. F. de Rooij, U. Staufer, T. Akiyama, and L. Aeschimann. Using microtechnology to get to nanotechnology. Machine Design, page 65, 2004. 321. [ DOI | Details ] S. Gautsch, T. Akiyama, R. Imer, N. F. de Rooij, U. Staufer, P. Niedermann, L. Howald, D. Brändlin, A. Tonin, H.-R. Hidber, and W. T. Pike. Measurement of quartz particles by means of an atomic force microscope for planetary exploration. Surf. Interface Anal., 33:163-167, 2002. 282. [ DOI | Details ] U. Staufer, T. Akiyama, C. Beuret, S. Gautsch, W. Noell, G. Schürmann, C. Stebler, and N. F. de Rooij. Micro-electromechanical systems for nanoscience. Journal of Nanoparticle Research, 2:413-418, 2000. 234. [ DOI | Details ] S. Gautsch and U. Staufer. Un microscope sonde les poussières martiennes. Journal Ingénieur et Architectes Suisses, 11:228-230, 2000. 224. [ DOI | Details ]

Skills Tools for nanoscience Functionalisation of SPM probes E-beam lithography MEMS for Space Phd Students Loizeau Frédéric Wu Yexian