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Administrative data

Philippe Buffat

philippe.buffat@epfl.ch

Nationality: Swiss and French

EPFL SB-DO
PH L1 500 (Bâtiment PH)
Station 3
1015 Lausanne

Office: PH L1 500
EPFL › SB › SB-DEC › PH-SB

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

Office: MXC 132
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE

Website: https://cime.epfl.ch

Expertise

HRTEM, HRSTEM, WTEM, RTEM, SEM, EDS
Nanodiffraction, precession
EDS microanalysis
Image simulation
Nanoparticles
- structure
- size effects
- e- irradiation
- phase identfication
Biominerals
- hydroxyapatite,Ca-P
III-V semiconductors
- quantum wells
- interface abruptness and planeity
Ti-base coatings
- nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition
- perovskites
Ni-base superalloys
- phases structure composition
- atom column EDS mapping
Phase identification in Mn-Si thermoelectrics
Swift ion irradiation defects in YBa2Cu3O7

Expertise

HRTEM, HRSTEM, WTEM, RTEM, SEM, EDS
Nanodiffraction, precession
EDS microanalysis
Image simulation
Nanoparticles
- structure
- size effects
- e- irradiation
- phase identfication
Biominerals
- hydroxyapatite,Ca-P
III-V semiconductors
- quantum wells
- interface abruptness and planeity
Ti-base coatings
- nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition
- perovskites
Ni-base superalloys
- phases structure composition
- atom column EDS mapping
Phase identification in Mn-Si thermoelectrics
Swift ion irradiation defects in YBa2Cu3O7

Current Work

Electron microscopy, of inorganic materials: recording experimental data, interpretation and image simulation.
Multilayered structures, free or embedded nano-particles, phase identification.

Education

physique

| Solid state physics

1971 – 2025 Freelance electron microscopist. EM prof. EPFL.
Directed by Freelance electron microscopist. EM prof. EPFL.

Infoscience

Teaching & PhD

Past EPFL PhD Students

Klaus Leifer, Alain Sfera, Cyril Cayron