Mounir Driss Mensi

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Scientist

mounir.mensi@epfl.ch +41 21 695 80 12

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office:  I17 1 J4
EPFL > SB > ISIC > ISIC-XRDSAP

Web site:  Web site:  https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics/

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office:  I17 1 J4
EPFL > VPA-AVP-PGE > AVP-PGE-EDOC > EDCH-ENS

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office:  I17 1 J4
EPFL > VPO-SE > OHS > COSEC-SB

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Administrative data

Teaching & PhD

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).