Mounir Driss Mensi

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Scientist

mounir.mensi@epfl.ch +41 21 695 80 12

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office:  I17 1 J4
EPFL > SB > ISIC > ISIC-XRDSAP

Web site:  Web site:  https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics/

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office:  I17 1 J4
EPFL > VPA-AVP-DLE > AVP-DLE-EDOC > EDCH-ENS

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Teaching & PhD

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Characterization of Materials 2025

This course introduces materials characterization techniques used by scientists and engineers. Lectures cover basic theory, applications, and limitations, while lab sessions offer hands-on experience, providing a well-rounded understanding of each method.