Mounir Driss Mensi

mounir.mensi@epfl.ch +41 21 695 80 12

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EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office: I17 1 J4
EPFL › VPA › VPA-AVP-DLE › AVP-DLE-EDOC › EDCH-ENS

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office: I17 1 J4
EPFL › SB › ISIC › ISIC-XRDSAP

Website: https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics/

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 80 12
Office: I17 1 J4
EHE › PARTENAIRES › PART-INSTIT › SIS-SECOURS-SION

Teaching & PhD

Courses

Advanced Solid State and Surface Characterization

CH-633

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Characterization of Materials 2025

MSE-716

This course introduces materials characterization techniques used by scientists and engineers. Lectures cover basic theory, applications, and limitations, while lab sessions offer hands-on experience, providing a well-rounded understanding of each method.