Alex Dommann

EPFL > VPA-AVP-DLE > AVP-DLE-EDOC > EDMX-ENS

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Administrative data

Teaching & PhD

Courses

X-Ray Analysis for thin films

(Coursebook not yet approved by the section)

CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

(Coursebook not yet approved by the section)