Emad Oveisi
Website: https://cime.epfl.ch
+41 21 695 82 26
EPFL › P › P-EM › CCE
Website: https://cce.epfl.ch/
+41 21 695 82 26
EPFL › P › P-EM › AE
Website: https://ae.epfl.ch/
+41 21 695 82 26
Office:
ALP 3 006
EPFL › VPA › VPA-AVP-DLE › AVP-DLE-EDOC › EDMX-ENS
Expertise
- Aberration-corrected S/TEM
- Analytical SEM/TEM techniques
- Electron diffraction techniques
- Three-dimensional electron imaging
Mission
- Manage the electron microscopy platform at EPFL Valais Wallis, ensuring cutting-edge capabilities for researchers.
- Advise and support EPFL scientists with advanced microscopy techniques and services.
- Develop and apply novel microscopy methods to support research at EPFL.
- Teach and mentor students and researchers in electron microscopy.
- Contribute to and engage in EPFL’s academic and governance initiatives.
Current Work
- Micro-ED
- Electron imaging of beam-sensitive materials; 2D materials, MOFs, COFs, Zeolite
- 3D reconstruction from a limited number of EM datasets
Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 12 research groups and more than 250 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assists their research to the highest level possible. Emad Oveisi's research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM.
Emad Oveisi's pioneering work in the field of electron microscopy has earned him two prestigious awards: the Microscopy Innovation Award for his invention of the "Single-shot three-dimensional electron imaging" technique, which allows real-time 3D imaging of in situ dynamics, and the Rodolphe and Renée Haenny Prize for his important contributions to the development of electron microscopy techniques and his dedication to teaching.
In addition to the scientific work, Emad is actively involved in the academic and social life of EPFL. He is currently a member of the EPFL School Assembly. Since 2019, he has been an elected member of EPFL Teachers Council (CCE) and has also been elected as one of the four members of its Bureau. This role allows him to be exposed to new ideas and pedagogical challenges, as well as being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL. Emad also represents the teaching community in the Campuses Energy Commission (CECOM) and COVID-19 Operating Committee of EPFL.
Education
PhD
| Materials Science and Engineering
2010 – 2014
EPFL
Directed by
Cécile Hébert
MSc
| Materials Science and Engineering2008 – 2008 University of Tehran
BSc
| Metallurgy and Materials Engineering2005 – 2005 University of Tehran
Awards
Microscopy Innovation Award
Cambridge University
2018
R&R Haenny Prize
Société Académique Vaudoise
2020
Research and Teaching Associate
School of Basic Sciences - EPFL
2022
Publications
Teaching & PhD
Past EPFL PhD Students as codirector
Courses
Advanced Solid State and Surface Characterization
CH-633
State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).
Characterization of Materials 2025
MSE-716
This course introduces materials characterization techniques used by scientists and engineers. Lectures cover basic theory, applications, and limitations, while lab sessions offer hands-on experience, providing a well-rounded understanding of each method.
Scanning and Analytical Transmission Electron Microscopy
MSE-735
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.
Scanning electron microscopy techniques (a)
MSE-636(a)
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.
Scanning electron microscopy techniques (b)
MSE-636(b)
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.
Transmission electron microscopy and diffraction (a)
MSE-637(a)
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.
Transmission electron microscopy and diffraction (b)
MSE-637(b)
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.