Emad Oveisi

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Collaborateur scientifique senior

emad.oveisi@epfl.ch +41 21 695 82 26

EPFL Valais Wallis
I17 1 J4 (Industrie 17)
Rue de l'Industrie 17
CH-1951 Sion

+41 21 695 82 26
Local:   I17 1 J4
Local:   MXC 135
EPFL > VPA > VPA-AVP-CP > CIME > CIME-GE

Web site:   Site web:   https://cime.epfl.ch

EPFL STI SMX-GE
MXG 335 (Bâtiment MXG)
Station 12
CH-1015 Lausanne

+41 21 693 68 13
+41 21 695 82 26
Local:   MXF 112
Local:   MXC 135
EPFL > STI > STI-SMX > SMX-ENS

EPFL AVP-PGE EDCH-ENS
BCH 3313 (Batochime UNIL)
Av. F.-A. Forel 2
CH-1015 Lausanne

+41 21 693 68 13
+41 21 695 82 26
Local:   BCH 3313
Local:   MXC 135
EPFL > VPA > VPA-AVP-PGE > AVP-PGE-EDOC > EDCH-ENS

EPFL P-SG CCE
CH C2 397 (Bâtiment CH)
Station 6
CH-1015 Lausanne

+41 21 693 68 13
+41 21 695 82 26
Local:   PH D2 354
Local:   MXC 135
EPFL > P > P-SG > CCE

Web site:   Site web:   https://cce.epfl.ch/

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Données administratives

Domaines de compétences

Transmission electron microscopy 
High resolution transmission electron microscopy 
Electron diffraction 
3D imaging of dislocation

Formation

PhD

Materials Science and Engineering

EPFL

2014

MSc

Materials Science and Engineering

University of Tehran

2008

BSc

Metallurgy and Materials Engineering

University of Tehran

2005

Enseignement & Phd

Doctorants

Ganeeva Gulnaz,

Cours

Advanced Solid State and Surface Characterization

Scanning electron microscopy techniques (a)

Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques EDS and EBSD, related theories of image formation.

Demonstrations will be given on the microscopes.



2x Year Spri

Transmission electron microscopy and diffraction (a)

This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.

Transmission electron microscopy and diffraction (b)

This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.

Fundamentals of STEM lmaging and Spectroscopy

Scanning and Analytical Transmission Electron Microscopy

This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.

Demonstrations

CCMX Summer School - Characterisation of Materials