Antonia Neels

Teaching & PhD

PhD Programs

Doctoral Program in Microsystems and Microelectronics

Past EPFL PhD Students

Bandi Tobias ,


CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.