Pascal Alexander Schouwink

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pascal.schouwink@epfl.ch +41 21 695 82 80 https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 82 80
Office:  BCH 2117
Office:  I17 0 G2
Office:  CH H1 615
EPFL > SB > ISIC > ISIC-XRDSAP

Web site:  Web site:  https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics/

+41 21 695 82 80
EPFL > VPA-AVP-DLE > AVP-DLE-EDOC > EDCH-ENS

+41 21 695 82 80
EPFL > VPA-AVP-DLE > AVP-DLE-EDOC > EDMX-ENS

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Administrative data

Teaching & PhD

Courses

Principles and Applications of X-ray Diffraction

(Coursebook not yet approved by the section)

Advanced Solid State and Surface Characterization

(Coursebook not yet approved by the section)