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Lucie Navratilova

EPFL CIME
MXC 115 (Bâtiment MXC)
Station 12
1015 Lausanne

Expertise

Microscopie électronique à balayage MEB (SEM)
Microscope SEM/FIB
Analyse EDX

Cours

Scanning electron microscopy techniques (b)

MSE-636(b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

3D Electron Microscopy and FIB-Nanotomography

MSE-704

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.

Scanning electron microscopy techniques (a)

MSE-636(a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.