Victor Boureau
EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 44 30
Office: MXC 133
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Site web: https://cime.epfl.ch
Expertise
- Aberration-corrected TEM and STEM
- Quantitative fields mapping (electron holography, DPC, 4D-STEM)
- Electron diffraction
- Analytical STEM
Doctorant·es actuel·les
Cours
Fundamentals of STEM lmaging and Spectroscopy
Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.
Scanning and Analytical Transmission Electron Microscopy
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.
Transmission electron microscopy and diffraction (a)
MSE-637(a)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.
Transmission electron microscopy and diffraction (b)
MSE-637(b)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.