Victor Boureau
EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 44 30
Office: MXC 133
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Site web: https://cime.epfl.ch
Expertise
- Aberration-corrected TEM and STEM
- Quantitative fields mapping (electron holography, DPC, 4D-STEM)
- Electron diffraction
- Analytical STEM
Enseignement et PhD
Current Phd
Courses
Fundamentals of STEM lmaging and Spectroscopy
Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.
Scanning and Analytical Transmission Electron Microscopy
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.
Transmission electron microscopy and diffraction (a)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.
Transmission electron microscopy and diffraction (b)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.