David Reyes
+41 21 693 61 88
Office: MXC 134
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Site web: https://cime.epfl.ch
+41 21 693 61 88
Office: MXC 134
EPFL › VPA › VPA-AVP-DLE › AVP-DLE-EDOC › EDMX-ENS
Expertise
- Electron energy loss spectroscopy (EELS)
- Aberration-corrected TEM and STEM
Cours
Scanning and Analytical Transmission Electron Microscopy
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.