Aïcha Hessler-Wyser
Senior Scientist
aicha.hessler@epfl.ch +41 21 693 48 30 https://www.epfl.ch/labs/pvlab/
Citizenship: CH
EPFL STI IMT PV-LAB
MC A2 305 (Bâtiment MC)
Rue de la Maladière 71b, CP 526
2002 Neuchâtel 2
Web site: Web site: https://pvlab.epfl.ch/
Fields of expertise
TEM, SEM
Photovoltaïcs
Material Science
Materials for Energy
Nanophysics
Metallurgy (metals, superalloys, SMA, powders...)
Biography
After a Master and a PhD in Physics at EPFL in the field of Electron Microscopy, I joined the Centre for Electron Microscopy and Microanalysis of the University of Western Australia (UWA) in Perth in 2000. In 2002, I came back to EPFL at the Centre for Electron Microscopy (CIME) of EPFL as scientific researcher with Prof. C. Hébert, and as responsible for various projects in the field of material science (solid oxide fuel cells, photovoltaic and metallurgy). I have supervised 6 PhD students in material sciences, and took part of the teaching duties for bachelor, master and PhD students, as well as in the TEM users training and support. In 2012, I joint part time the Laboratory of Photovoltaïcs and Thin-Film Electronics (PVlab) as deputy director of the laboratory. I work full time there since 2014.School Assembly
I have been part of the basic science school council and of the school assembly (AE) for nearly 5 and 9 years, respectively. It gave me the opportunity to express my opinion on various project and to defend EPFL collaborator's interests. I appreciated the constructive way that AE communicates with the Direction and tries to find optimal solutions for the whole community. I would like to continue to be active in school participation, therefore I am again candidate for the school assembly. In addition, as part of IMT EPFL Neuchâtel, I believe it is very important that external antenna from EPFL has representative at the school assembly to maintain a good connection with the main campus life.Publications
Infoscience publications
Selected publications
Jeangros, Q
Hansen, T.W.
Wagner, J.B,
Dunin-Borkowski, R.E.
H�bert, C.
Van herle, J
Hessler-Wyser, A Acta Materialia, Vol 67 (2014), 362-372 |
Oxidation mechanism of nickel particles studied in an environmental transmission electron microscope |
Pasche, G
SCheel, M
Sch�ublin, R
H�bert, C.
Rappaz, M
Hessler-Wyser, A Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science 44(9):(2013) 4119-4123 |
Time-resolved X-ray microtomography observation of inter metallic formation between solid Fe and liquid Al |
Schuler, A
Wuillemin, Z
Hessler-Wyser, A
Comminges, C
Steriner, N. Y
Van herle, J Journal of Power Sources, Vol 211 (2012) 177-183 |
Cr-poisoning in (La,Sr)(Co, Fe)O3 cathodes after 10'000h SOFC stack testing |
Vannod, J
Bornert, M
Bidaux, J-E
Bataillard, L
Karimi, A
Drezet, J-M
Rappaz, M
Hessler-Wyser, A Acta Materialia, Vol 59, 17 (2011) 6538-6546 |
Mechanical and microstructural integrity of nickel-titanium and stainless steel laser joined wires |
Cusanelli, G., R. Fl�kiger, A. Hessler-Wyser, F. Bobard, R. Demellayer, and R. Perez Journal of Materials Processing Technology, 2004. 149(1-3): p. 289-295 |
Microstructure at submicron scale of the white layer produced by EDM technique |
Leifer, K., S. Mautino, H. Weman, A. Rudra, E. Pelucchi, F. Bobard, A. Wyser, and E. Kapon Design and Nature, 2004. 6: p. 131 |
Use of quantitative EELS and cathodoluminescence for study of carrier confinement and diffusion in self organized vertical quantum wells |
Ballif, C., D.M. Huljic, G. Willeke, and A. Hessler-Wyser Applied Physics Letters, 2003. 82(12): p. 1878-1880 |
Silver thick-film contacts on highly doped n-type silicon emitters: Structural and electronic properties of the interface |
Crevoiserat, S., T. Lehnert, A. Hessler-Wyser, and R. Gotthardt Journal De Physique. IV: JP, 2001. 11(8) |
TEM studies of in situ martensitic transformation in NiTi thin films |
Hessler-Wyser, A., A. Cuenat, M. D�beli, C. Abromeit, and R. Gotthardt Philosophical Magazine Letters, 2001. 81(12): p. 893-899 |
Multilayered phase formation after high-fluence implantation of nickel into aluminium |
Cuenat, A., R. Sch�ublin, A. Hessler-Wyser, and R. Gotthardt Ultramicroscopy, 2000. 83(3-4): p. 179-191 |
Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure Al. Ultramicroscopy |
Wyser, A., R. Gotthardt, and R. Sch�ublin Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1996. 107(1-4): p. 273-275 |
Amorphization in Al induced by high-energy Ni ion implantation |
Teaching & PhD
Teaching
Materials Science and Engineering
PhD Students
Courtant Marie Amélie Camille, Ongaro Chiara, Othman Mostafa Rabie Shlaly Bahr,Past EPFL PhD Students
Deillon Léa , Faes Antonin , Hain Caroline , Jeangros Quentin Thomas , Landucci Federica , Libraro Sofia , Pasche Guillaume , Schuler Josef Andreas , Thomet Jonathan Emanuel , Vannod Jonas ,Courses
Introduction to microscopy Laboratory work
This course of introduction to microscopy aims at giving an overview of the various techniques of microstructure and composition analysis of materials. It focuses in particular on electron and optical microscopy. This course is composed of lectures and practical demonstrations on microscopes.