Antonia Neels

Chargée de cours

antonia.neels@epfl.ch

Unité: EDMX-ENS

Données administratives

Enseignement & Phd

Enseignement

Programmes doctoraux

  • Doctoral Program in Microsystems and Microelectronics

Doctorants

Cours

CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measure... goto