Antonia Neels

Données administratives

Enseignement & Phd

Programmes doctoraux

Doctoral Program in Microsystems and Microelectronics

A dirigé les thèses EPFL de

Bandi Tobias ,


CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.