Blaise Cuénod
EPFL CMI
BM 1127 (Bâtiment BM)
Station 17
1015 Lausanne
+41 21 693 57 68
Office:
BM 1127
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Publications
Infoscience publications
Quantitative study of the thickness-dependent stress in indium tin oxide thin films
Thin Solid Films. 2023-12-09. DOI : 10.1016/j.tsf.2023.140163.Industrialization of hybrid Si/III-V and translucent planar micro-tracking modules
Progress In Photovoltaics. 2021. DOI : 10.1002/pip.3387.Selected publications
| Mark Aarts, Willem Q. Boon, Blaise Cuénod, Marjolein Dijkstra, René van Roij, and Esther Alarcon-Llado ACS Applied Materials & Interfaces |
Ion Current Rectification and Long-Range Interference in Conical Silicon Micropores. |