Fields of expertise
|Director||Institute of Microengineering (IMT)|
|Head of Laboratory||Integrated Circuits Laboratory (ICLAB)|
|Full Professor||School of Engineering (STI)|
Research InterestsChristian C. Enz is the head of the Integrated Circuits Laboratory (ICLAB), operating in Microcity, the new EPFL antenna in Neuchâtel. He is directed towards low-power and low-voltage electronics and his research covers the following areas:
BiographyChristian C. Enz (M84, S'12) received the M.S. and Ph.D. degrees in Electrical Engineering from the EPFL in 1984 and 1989 respectively. From 1984 to 1989 he was research assistant at the EPFL, working in the field of micro-power analog IC design. In 1989 he was one of the founders of Smart Silicon Systems S.A. (S3), where he developed several low-noise and low-power ICs, mainly for high energy physics applications. From 1992 to 1997, he was an Assistant Professor at EPFL, working in the field of low-power analog CMOS and BiCMOS IC design and device modeling. From 1997 to 1999, he was Principal Senior Engineer at Conexant (formerly Rockwell Semiconductor Systems), Newport Beach, CA, where he was responsible for the modeling and characterization of MOS transistors for the design of RF CMOS circuits. In 1999, he joined the Swiss Center for Electronics and Microtechnology (CSEM) where he launched and lead the RF and Analog IC Design group. In 2000, he was promoted Vice President, heading the Microelectronics Department, which became the Integrated and Wireless Systems Division in 2009. He joined the EPFL as full professor in 2013, where he is currently the director of the Institute of Microengineering (IMT) and head of the Integrated Circuits Laboratory (ICLAB). He is lecturing and supervising undergraduate and graduate students in the field of Analog and RF IC Design at EPFL. His technical interests and expertise are in the field of very low-power analog and RF IC design, semiconductor device modeling, and inexact and error tolerant circuits and systems. He has published more than 200 scientific papers and has contributed to numerous conference presentations and advanced engineering courses. Together with E. Vittoz and F. Krummenacher he is one of the developer of the EKV MOS transistor model and the author of the book "Charge-Based MOS Transistor Modeling - The EKV Model for Low-Power and RF IC Design" (Wiley, 2006). He has been member of several technical program committees, including the International Solid-State Circuits Conference (ISSCC) and European Solid-State Circuits Conference (ESSCIRC). He has served as a vice-chair for the 2000 International Symposium on Low Power Electronics and Design (ISLPED), exhibit chair for the 2000 International Symposium on Circuits and Systems (ISCAS) and chair of the technical program committee for the 2006 European Solid-State Circuits Conference (ESSCIRC). Since 2012 he has been elected as member of the IEEE Solid-State Circuits Society (SSCS) Administrative Commmittee (AdCom). He is also Chair of the IEEE SSCS Chapter of Switzerland.
Influence of Fin and Finger Number on TID Degradation of 16-nm Bulk FinFETs Irradiated to Ultrahigh DosesIeee Transactions On Nuclear Science. 2022-03-01. DOI : 10.1109/TNS.2021.3125769.
New Technologies to Enhance the Figures-of-Merit of GaN Power DevicesLausanne, EPFL, 2022. DOI : 10.5075/epfl-thesis-9625.
Nanowatt Acoustic Inference Sensing Exploiting Nonlinear Analog Feature ExtractionIeee Journal Of Solid-State Circuits. 2021-10-01. DOI : 10.1109/JSSC.2021.3076344.
Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing2021-09-13. 47th European Solid State Circuits Conference (ESSCIRC 2021), Grenoble, France, Septembre 13-22, 2021. p. 71-74. DOI : 10.1109/ESSCIRC53450.2021.9567747.
In-depth Cryogenic Characterization of 22 nm FDSOI Technology for Quantum Computation2021-09-01. 7th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS'2021), Caen, France, Septembre 1-3, 2021. p. 1-4. DOI : 10.1109/EuroSOI-ULIS53016.2021.9560181.
TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh DosesIeee Transactions On Nuclear Science. 2021-08-01. DOI : 10.1109/TNS.2021.3076977.
Power-Optimized Digitally Controlled Oscillator in 28-nm CMOS for Low-Power FMCW RadarsIeee Microwave And Wireless Components Letters. 2021-08-01. DOI : 10.1109/LMWC.2021.3092182.
Generalized Boltzmann relations in semiconductors including band tailsJournal Of Applied Physics. 2021-01-28. DOI : 10.1063/5.0037432.
Optimized Detection of Hypoglycemic Glucose Ranges in Human Serum by Raman Spectroscopy with 532 nm Laser Excitation2021-01-01. 10th International Conference on Photonics, Optics and Laser Technology (PHOTOPTICS), ELECTR NETWORK, Feb 10-11, 2022. p. 158-165. DOI : 10.5220/0010981300003121.
A 60 GHz QDCO with 11 GHz Seamless Tuning for Low-Power FMCW Radars in 22-nm FDSOI2021-01-01. 47th IEEE European Solid State Circuits Conference (ESSCIRC), ELECTR NETWORK, Sep 06-09, 2021. p. 291-294. DOI : 10.1109/ESSCIRC53450.2021.9567787.
An Optimized Low-Power Band-Tuning TX for Short-Range FMCW Radar in 22-nm FDSOI CMOS2021-01-01. 47th IEEE European Solid State Circuits Conference (ESSCIRC), ELECTR NETWORK, Sep 06-09, 2021. p. 467-470. DOI : 10.1109/ESSCIRC53450.2021.9567815.
Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh DosesIeee Transactions On Nuclear Science. 2020-07-01. DOI : 10.1109/TNS.2020.2981881.
Cryo-CMOS Compact Modeling2020-01-01. IEEE International Electron Devices Meeting (IEDM), ELECTR NETWORK, Dec 12-18, 2020. DOI : 10.1109/IEDM13553.2020.9371894.
A 49 mu W 6th-Order Chebyshev SSF-based Low-Pass Analog Filter for IEEE 802.11ax2020-01-01. IEEE International Symposium on Circuits and Systems (ISCAS), ELECTR NETWORK, Oct 10-21, 2020. DOI : 10.1109/ISCAS45731.2020.9180460.
Design and Optimization of Low Power and Low Light Sensor2020-01-01. IEEE Custom Integrated Circuits Conference (CICC), Boston, MA, Mar 22-25, 2020. DOI : 10.1109/CICC48029.2020.9075874.
Time-of-flight device and 3d optical detectorJP2022522952 ; US2022120873 ; EP3911972 ; KR20210127153 ; WO2020148570 . 2020.
FOSS EKV2.6 Verilog-A Compact MOSFET Model2019-01-01. 49th European Solid-State Device Research Conference (ESSDERC), Cracow, POLAND, Sep 23-26, 2019. p. 190-193. DOI : 10.1109/ESSDERC.2019.8901822.
Health monitoring deviceJP2020527402 ; US2020205680 ; EP3654827 ; CN110958851 ; KR20200028002 ; WO2019016191 . 2019.
Teaching & PhD
Doctoral Program in Microsystems and Microelectronics
Doctoral Program in Electrical Engineering