EPFL ENT-R CIME-GE
MXC 135 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

Web site: Web site: https://cime.epfl.ch

EPFL Valais Wallis
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Web site: Web site: https://isic.epfl.ch/valais

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Administrative data

Fields of expertise

Aberration-corrected S/TEM

Analytical SEM/TEM techniques

Electron diffraction techniques

Three-dimensional electron imaging

Single-shot three-dimensional electron imaging
Microscopy Today Innovation Award 2018

Education

Teaching & PhD

PhD Students

Ganeeva Gulnaz,

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Introduction to microscopy + Laboratory work

This course of introduction to microscopy aims at giving an overview of the various techniques of microstructure and composition analysis of materials. It focuses in particular on electron and optical microscopy. This course is composed of lectures and practical demonstrations on microscopes.

Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Transmission electron microscopy and diffraction (a)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Fundamentals of STEM lmaging and Spectroscopy

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.

Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.