Emad Oveisi

EPFL ENT-R CIME-GE
MXC 135 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

Unité: EDCH-ENS

EPFL Valais Wallis
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Données administratives

Compétences

Transmission electron microscopy
High resolution transmission electron microscopy
Electron diffraction
3D imaging of dislocation

Publications

Enseignement & Phd

Enseignement

Programmes doctoraux

Doctorants

Cours

Advanced Solid State and Surface Characterization

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Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques E... goto