Emad Oveisi

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

Web site:  Web site:  https://cime.epfl.ch

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

Web site:  Web site:  https://cce.epfl.ch/

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

Web site:  Web site:  https://ae.epfl.ch/

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Administrative data


Education

PhD

Materials Science and Engineering

EPFL

2014

MSc

Materials Science and Engineering

University of Tehran

2008

BSc

Metallurgy and Materials Engineering

University of Tehran

2005


Awards

Rodolphe and Renée Haenny Prize

For contribution to the development of electron microscopy techniques for research in materials science

2022

Microscopy Today Innovation Award

Single-shot 3D electron imaging

2018

Teaching & PhD

Past EPFL PhD Students

Ganeeva Gulnaz ,

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Transmission electron microscopy and diffraction (a)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Fundamentals of STEM lmaging and Spectroscopy

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.

Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

CCMX Summer School - Characterisation of Materials

This course will present an overview of the different materials characterisation techniques available to materials scientists, engineers in mechanical engineering, chemical engineering, microtechnology or physics.