Emad Oveisi

EPFL ENT-R CIME CIME-GE
MXC 135 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

EPFL E E-DOC EDCH-ENS

Unit: EDCH-ENS

EPFL SB ISIC ISIC-GE-VS
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Administrative data

Fields of expertise

Transmission electron microscopy
High resolution transmission electron microscopy
Electron diffraction
3D imaging of dislocations

Publications

Teaching & PhD

Teaching

PhD Programs

PhD Students

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and... goto

Doctoral Program in Chemistry and Chemical Engineering, 2018-2019, language : english