Emad Oveisi

EPFL ENT-R CIME-GE
MXC 135 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

Unit: EDCH-ENS

EPFL Valais Wallis
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Administrative data

Fields of expertise

Transmission electron microscopy
High resolution transmission electron microscopy
Electron diffraction
3D imaging of dislocations

Publications

Teaching & PhD

Teaching

PhD Programs

PhD Students

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and... goto


Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications. goto