Emad Oveisi

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Research and Teaching Associate

emad.oveisi@epfl.ch +41 21 695 82 26

I will be your voice at the school assembly
With the decision of the EPFL upper management to promote the Bottom-Up decision, the role of the School Assembly is more important than ever.

I wish to rejoin the EPFL Assembly and represent the Intermediate Body, ensuring our community's active participation in democratic processes. Alongside colleagues from other bodies, we will work to enable the School Assembly to contribute significantly to the school's governance. Having previously served as a member of the School Assembly, I bring a wealth of experience and dedication to this endeavor.

As a scientist working in a technology and research platform, I believe that representing the interests and views of the platform scientists - who play a pivotal role in the advancement of EPFL's research - in the School Assembly is essential to strengthening EPFL's position as a leading teaching and research institution. I am convinced that we do our best work when we have a strong sense of belonging, representation, and the opportunity to share our best thoughts and put forward our ideas.

I believe that my experience in representing several corps on various committees, which are listed below, will be a plus for my candidature.


  • 2023-Present: Representative of EPFL's Intermediate Body to The School Assembly
  • 2021-Present: Representative of EPFL teaching community to the Campuses Energy Commission (CECOM) and COVID-19 Operational Committee
  • 2019-Present: Member of the EPFL Teachers' Council (CCE) 
  • 2019-Present: Elected as one of the four members of CCE Bureau
  • 2016-2018: Representative of the intermediate body to the Council of the Institute of Chemistry (ISIC)

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

Web site:  Web site:  https://cime.epfl.ch

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

Web site:  Web site:  https://cce.epfl.ch/

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

EPFL CIME
ALP 3 006 (ALPOLE)
Rte des Ronquos 86
1950 Sion

Web site:  Web site:  https://ae.epfl.ch/

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Administrative data


Education

PhD

Materials Science and Engineering

EPFL

2014

MSc

Materials Science and Engineering

University of Tehran

2008

BSc

Metallurgy and Materials Engineering

University of Tehran

2005


Awards

Rodolphe and Renée Haenny Prize

For contribution to the development of electron microscopy techniques for research in materials science

2022

Microscopy Today Innovation Award

Single-shot 3D electron imaging

2018

Teaching & PhD

Past EPFL PhD Students

Ganeeva Gulnaz ,

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Transmission electron microscopy and diffraction (a)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Fundamentals of STEM lmaging and Spectroscopy

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.

Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

CCMX Summer School - Characterisation of Materials

This course will present an overview of the different materials characterisation techniques available to materials scientists, engineers in mechanical engineering, chemical engineering, microtechnology or physics.