The students will learn about the essential chemical, thermodynamic and physical mechanisms governing thin film growth, about the most important process techniques and their typical features, including process-microstructure-film properties relationships.
Propose suitable materials, design, and production routes depending on different performance criteria using a computer based software approach. The course is based on Prof. Mike Ashby's well known "Ashby plots" comparing different material properties (mechanical, thermal, chemical, etc.).
Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.