Lucie Navratilova

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lucie.navratilova@epfl.ch +41 21 693 54 27

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

Web site: Web site: https://cime.epfl.ch

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Administrative data

Fields of expertise

Scanning electron microscopy SEM
Dual beam microscope SEM/FIB
EDX analysis

Teaching & PhD

Courses

Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

3D Electron Microscopy and FIB-Nanotomography

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.