Lucie Navratilova
EPFL CIME
MXC 115 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 54 27
Office: MXC 115
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Website: https://cime.epfl.ch
Expertise
Dual beam microscope SEM/FIB
EDX analysis
Courses
3D Electron Microscopy and FIB-Nanotomography
The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.
Scanning electron microscopy techniques (a)
MSE-636(a)
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.
Scanning electron microscopy techniques (b)
MSE-636(b)
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.