Lucie Navratilova
EPFL CIME
MXC 115 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 54 27
Local:
MXC 115
EPFL
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VPA-AVP-CP
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CIME
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CIME-GE
Web site: Site web: https://cime.epfl.ch
Domaines de compétences
Microscopie électronique à balayage MEB (SEM)
Microscope SEM/FIB
Analyse EDX
Microscope SEM/FIB
Analyse EDX
Enseignement & Phd
Cours
Scanning electron microscopy techniques (a)
This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques EDS and EBSD, related theories of image formation.
Demonstrations will be given on the microscopes.
2x Year Spri
Demonstrations will be given on the microscopes.
2x Year Spri
3D Electron Microscopy and FIB-Nanotomography
Physics of the different signals generated by electron beams and focused ion beams.
- Underlying physical principles for the acquisition of data sets for 3D reconstruction: interaction volumes, voxel (3 dimensional "pixel") size, mechanical stability issues for successful recon-struction.
- surface reconstruction (SEM), serial (parallel) sectioning (SEM/FIB and TEM),