Marco Cantoni

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Operational Director

marco.cantoni@epfl.ch +41 21 693 48 16

Citizenship : Swiss

Birth date : 06.08.1963

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

Web site: Web site: https://cime.epfl.ch

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne

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Administrative data

Fields of expertise

TEM: High-resolution TEM

Analytical (EDX, EELS) STEM

SEM: HR-SEM, SEM-STEM, EDX, EBSD

Focused Ion Beam (FIB)

Ceramics, Ferroelectrics, Superconductors

nano.. (you name it)


Publications

Infoscience publications

Teaching & PhD

Teaching

Materials Science and Engineering

Physics

PhD Programs

Doctoral Program in Materials Science and Engineering

Past EPFL PhD Students

Bazzoni Amélie , Burdet Pierre , Nabiei Farhang ,

Courses

Introduction to microscopy Laboratory work

This course of introduction to microscopy aims at giving an overview of the various techniques of microstructure and composition analysis of materials. It focuses in particular on electron and optical microscopy. This course is composed of lectures and practical demonstrations on microscopes.

Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Transmission electron microscopy and diffraction (a)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

3D Electron Microscopy and FIB-Nanotomography

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.

Fundamentals of STEM lmaging and Spectroscopy

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.

Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

CCMX Summer School - Characterisation of Materials

This course will present an overview of the different materials characterisation techniques available to materials scientists, engineers in mechanical engineering, chemical engineering, microtechnology or physics.

Experimental methods in physics

The course's objectivs are: Learning several advenced methods in experimental physics, and critical reading of experimental papers.