Mounir Driss Mensi

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
CH-1951 Sion

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
CH-1951 Sion

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
CH-1951 Sion

Web site:  Web site:  https://sb.epfl.ch/conseil

EPFL VPRHO DSPS COSEC-SB
I17 1 I4 (Industrie 17)
Rue de l'Industrie 17, CP 440
CH-1951 Sion

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Administrative data

Teaching & PhD

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).