Mounir Driss Mensi

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Specialist in Spectroscopy

mounir.mensi@epfl.ch +41 21 69 58012

EPFL Valais Wallis
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Unit: EDCH-ENS

EPFL VPRHO DSPS COSEC-SB
I17 1 I4 (Industrie 17)
Rue de l'Industrie 17, CP 440
CH-1951 Sion

Administrative data

Teaching & PhD

Teaching

PhD Programs

PhD Students

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and... goto