Pascal Alexander Schouwink

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

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Administrative data

Teaching & PhD

Courses

Principles and Applications of X-ray Diffraction

Basic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter. Experimental aspects of materials-oriented powder and single crystal diffraction. Familiarization with modern X-ray diffractometers.

Advanced Solid State and Surface Characterization

(Coursebook not yet approved by the section)