Pascal Alexander Schouwink
pascal.schouwink@epfl.ch +41 21 695 82 80 https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics
EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion
Teaching & PhD
Courses
Advanced Solid State and Surface Characterization
CH-633
State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).
Principles and Applications of X-ray Diffraction
CH-632
Basic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter. Experimental aspects of materials-oriented powder and single crystal diffraction. Familiarization with modern X-ray diffractometers.