Pascal Alexander Schouwink

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pascal.schouwink@epfl.ch +41 21 695 82 80 https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
CH-1951 Sion

+41 21 695 82 80
Office:  I17 1 J4
Office:  CH J2 500
Office:  BCH 2117
EPFL > SB > ISIC > ISIC-XRDSAP

Web site:  Web site:  https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics/

+41 21 695 82 80
EPFL > VPA > VPA-AVP-PGE > AVP-PGE-EDOC > EDCH-ENS

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Administrative data

Teaching & PhD

Courses

Principles and Applications of X-ray Diffraction

Basic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter. Experimental aspects of materials-oriented powder and single crystal diffraction. Familiarization with modern X-ray diffractometers.

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).