Pascal Alexander Schouwink

EPFL Valais Wallis
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Web site: http://isic.epfl.ch/
Unit: ISIC-GE

Unit: EDCH-ENS

Administrative data

Teaching & PhD

Teaching

PhD Programs

PhD Students

Courses

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and... goto


Principles and Applications of X-ray Diffraction

Basic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter. Experimental aspects of materials-oriented powder and single crystal diffraction. Familiarization with modern X-ray diffractometers. goto