Pascal Alexander Schouwink

EPFL Valais Wallis
EPFL ISIC-GE-VS
Rue de l'Industrie 17
Case postale 440
CH-1951 Sion

Web site: Web site: https://isic.epfl.ch/valais

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Administrative data

Teaching & PhD

Courses

Principles and Applications of X-ray Diffraction

(Coursebook not yet approved by the section)

Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).