Shreyas Sanjay Joglekar

EPFL STI IMX LMGN
BM 3139 (Bâtiment BM)
Station 17
1015 Lausanne

Web site:  Web site:  https://lmgn.epfl.ch/

EPFL > ETU > EDOC > EDMX

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Administrative data

Fields of expertise

Characterization tools (Independent handling experience):
Transmission Electron Microscopy (FEI-Talos: Basic training), Scanning Electron Microscopy (SEM-EDX), Atomic Force Microscopy, Raman Spectroscopy, X-ray Diffraction spectroscopy (Powder XRD and Grazing Incidence for thin films) and Standard Metallography
 
Softwares: 
OriginPro 8.5, Matlab2018b, Mathematica 11.3,ImageJ, Nanoscope Analysis 1.7 
 
Clean room basic training

Education

B.tech

Metallurgical Engineering

College of Engineering, Pune

2013-2017