Shreyas Sanjay Joglekar
Nationality: Indian
Website: https://lmgn.epfl.ch/
Expertise
Characterization tools (Independent handling experience):
Transmission Electron Microscopy (FEI-Talos: Basic training), Scanning Electron Microscopy (SEM-EDX), Atomic Force Microscopy, Raman Spectroscopy, X-ray Diffraction spectroscopy (Powder XRD and Grazing Incidence for thin films) and Standard Metallography
Softwares:
OriginPro 8.5, Matlab2018b, Mathematica 11.3,ImageJ, Nanoscope Analysis 1.7
Clean room basic training
Transmission Electron Microscopy (FEI-Talos: Basic training), Scanning Electron Microscopy (SEM-EDX), Atomic Force Microscopy, Raman Spectroscopy, X-ray Diffraction spectroscopy (Powder XRD and Grazing Incidence for thin films) and Standard Metallography
Softwares:
OriginPro 8.5, Matlab2018b, Mathematica 11.3,ImageJ, Nanoscope Analysis 1.7
Clean room basic training
Expertise
Characterization tools (Independent handling experience):
Transmission Electron Microscopy (FEI-Talos: Basic training), Scanning Electron Microscopy (SEM-EDX), Atomic Force Microscopy, Raman Spectroscopy, X-ray Diffraction spectroscopy (Powder XRD and Grazing Incidence for thin films) and Standard Metallography
Softwares:
OriginPro 8.5, Matlab2018b, Mathematica 11.3,ImageJ, Nanoscope Analysis 1.7
Clean room basic training
Transmission Electron Microscopy (FEI-Talos: Basic training), Scanning Electron Microscopy (SEM-EDX), Atomic Force Microscopy, Raman Spectroscopy, X-ray Diffraction spectroscopy (Powder XRD and Grazing Incidence for thin films) and Standard Metallography
Softwares:
OriginPro 8.5, Matlab2018b, Mathematica 11.3,ImageJ, Nanoscope Analysis 1.7
Clean room basic training
Education
B.tech
| Metallurgical Engineering2013 – 2017 College of Engineering, Pune
Master
| Materials Science and Engineering2018 – 2021 EPFL