Victor Boureau
EPFL CIME
MXC 133 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 44 30
Office:
MXC 133
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Site web: https://cime.epfl.ch
Expertise
- Aberration-corrected TEM and STEM
- Quantative microscopy
- Electron diffraction
- Strain mapping (GPA, precession 4D-STEM)
- Electric and magnetic field mapping (electron holography, DPC, 4D-STEM)
Enseignement et PhD
A co-dirigé les thèses EPFL de
Cours
Introduction à la microscopie + TP
MSE-352
Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux microscopies électronique et optique. Le cours comprend des cours ainsi que des démonstrations.
Transmission electron microscopy and diffraction (a)
MSE-637(a)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.
Transmission electron microscopy and diffraction (b)
MSE-637(b)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.