Victor Boureau
EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 44 30
Office:
MXC 133
EPFL
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VPA-AVP-CP
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CIME
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CIME-GE
Web site: Web site: https://cime.epfl.ch
Fields of expertise
- Aberration-corrected TEM and STEM
- Quantitative fields mapping (electron holography, DPC, 4D-STEM)
- Electron diffraction
- Analytical STEM
Teaching & PhD
PhD Students
Ranieri Pierpaolo,Courses
Transmission electron microscopy and diffraction (a)
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.
Transmission electron microscopy and diffraction (b)
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.
CCMX - ScopeM Advanced Course - Advanced Characterization of Materials at the Micro, Nano and Atomic Scales
The course focuses on morphological and analytical structure research methods for materials science using electrons, photons and ions.
Fundamentals of STEM lmaging and Spectroscopy
Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.
Scanning and Analytical Transmission Electron Microscopy
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.