Victor Boureau
EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 44 30
Office: MXC 133
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Site web: https://cime.epfl.ch
Expertise
- Aberration-corrected TEM and STEM
- Quantitative field mapping (electron holography, DPC, 4D-STEM)
- Electron diffraction
- Analytical STEM
Enseignement et PhD
Current Phd
Courses
Transmission electron microscopy and diffraction (a)
MSE-637(a)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.
Transmission electron microscopy and diffraction (b)
MSE-637(b)
This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.