Johann Michler

EPFL STI SMX-GE
MXF 112 (Bâtiment MXF)
Station 12
CH-1015 Lausanne

Office:  MXF 112
EPFL > STI > STI-SMX > SMX-ENS

EPFL AVP-PGE EDMX-ENS
MXF 110 (Bâtiment MXF)
Station 12
CH-1015 Lausanne

EPFL > STI > IMX > IMX-GE

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Administrative data

Teaching & PhD

Teaching

Materials Science and Engineering,

PhD Programs

Doctoral Program in Materials Science and Engineering

Doctoral Program in Manufacturing Systems and Robotics

Courses

Thin film fabrication technologies

(Coursebook not yet approved by the section)

Materials selection

(Coursebook not yet approved by the section)

21Intro Scanning electron microscopy techniques

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.