Alex Dommann
Enseignement & Phd
Cours
X-Ray Analysis for thin films
Introduction into the relation between physical and structural properties
Introduction into different X-Ray techniques
Examples of successful technological transfer using X-Ray techniques
Introduction into different X-Ray techniques
Examples of successful technological transfer using X-Ray techniques
- structural properties
- relation between mechanical, electrical and structural properties
- coherent and non coherent scattering
- high resolution X-
CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.