Xavier Maeder
Enseignement & Phd
Doctorants
Bojarski Samuel Felix, Hamulka Kamila Elzbieta, Kroeker Philipp Konrad Clewie,A dirigé les thèses EPFL de
Della Ventura Nicolò Maria ,Cours
X-Ray Analysis for thin films
Introduction into the relation between physical and structural properties
Introduction into different X-Ray techniques
Examples of successful technological transfer using X-Ray techniques
Introduction into different X-Ray techniques
Examples of successful technological transfer using X-Ray techniques
- structural properties
- relation between mechanical, electrical and structural properties
- coherent and non coherent scattering
- high resolution X-