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Xavier Maeder

Courses

21Intro Scanning electron microscopy techniques

MSE-609

Introduction to SEM and FIB microanalysis

MSE-675

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

X-Ray Analysis for thin films

MSE-627

Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.