21Intro Scanning electron microscopy techniques

MSE-609

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.

Introduction to SEM and FIB microanalysis

MSE-675

X-Ray Analysis for thin films

MSE-627