Xavier Maeder
Teaching & PhD
PhD Programs
Doctoral Program in Materials Science and Engineering
Courses
21Intro Scanning electron microscopy techniques
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
Introduction to scanning electron microscopy microanalysis techniques
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number
of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on
advanced techniques and practical work.