Xavier Maeder

EPFL CCMX
MXG 232 (Bâtiment MXG)
Station 12
CH-1015 Lausanne

Office:  MXG 232
EPFL > VPA > VPA-AVP-CP > CCMX > CCMX-GE

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Administrative data

Teaching & PhD

PhD Programs

Doctoral Program in Materials Science and Engineering

Courses

21Intro Scanning electron microscopy techniques

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Introduction to scanning electron microscopy microanalysis techniques

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.