Teaching & PhD
PhD Students
Samuel Felix Bojarski, Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker
Past EPFL PhD Students as codirector
Courses
Introduction to SEM and FIB microanalysis
MSE-675
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
X-Ray Analysis for thin films
MSE-627
Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.