Xavier Maeder
Teaching & PhD
Past EPFL PhD Students
Della Ventura Nicolò Maria ,Courses
21Intro Scanning electron microscopy techniques
Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.