Xavier Maeder

vCard
Administrative data

Teaching & PhD

PhD Students

Bojarski Samuel Felix, Hamulka Kamila Elzbieta, Kroeker Philipp Konrad Clewie,

Past EPFL PhD Students

Della Ventura Nicolò Maria ,

Courses

X-Ray Analysis for thin films

Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.

Introduction to SEM and FIB microanalysis

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.