Doctorant·es actuel·les
Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker, Samuel Felix Bojarski
A dirigé les thèses EPFL de
Cours
Introduction to SEM and FIB microanalysis
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
X-Ray Analysis for thin films
Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.