Enseignement et PhD
Current Phd
Samuel Felix Bojarski, Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker
Past Phd As Codirector
Courses
Introduction to SEM and FIB microanalysis
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
X-Ray Analysis for thin films
Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.