David Reyes

david.reyesvasquez@epfl.ch +41 21 693 61 88

+41 21 693 61 88
Office:  MXC 134
EPFL > VPA-AVP-CP > CIME > CIME-GE

Web site:  Web site:  https://cime.epfl.ch

+41 21 693 61 88
Office:  MXC 134
EPFL > VPA-AVP-DLE > AVP-DLE-EDOC > EDMX-ENS

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Administrative data

Teaching & PhD

Courses

Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.