Lucie Navratilova
EPFL CIME
MXC 115 (Bâtiment MXC)
Station 12
1015 Lausanne
+41 21 693 54 27
Local:
MXC 115
EPFL
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Web site: Site web: https://cime.epfl.ch
Domaines de compétences
Microscope SEM/FIB
Analyse EDX
Enseignement & Phd
Cours
Scanning electron microscopy techniques (b)
Demonstrations will be given on the microscopes.
2x Year Spri
3D Electron Microscopy and FIB-Nanotomography
- Underlying physical principles for the acquisition of data sets for 3D reconstruction: interaction volumes, voxel (3 dimensional "pixel") size, mechanical stability issues for successful recon-struction.
- surface reconstruction (SEM), serial (parallel) sectioning (SEM/FIB and TEM),