Pascal Alexander Schouwink

photo placeholder image

pascal.schouwink@epfl.ch +41 21 695 82 80 https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
CH-1951 Sion

+41 21 695 82 80
Local:   I17 1 J4
Local:   CH J2 500
Local:   BCH 2117
EPFL > SB > ISIC > ISIC-XRDSAP

+41 21 695 82 80
EPFL > VPA > VPA-AVP-PGE > AVP-PGE-EDOC > EDCH-ENS

vCard
Données administratives

Enseignement & Phd

Cours

Principles and Applications of X-ray Diffraction

Advanced Solid State and Surface Characterization