Données administratives

Pascal Alexander Schouwink

pascal.schouwink@epfl.ch +41 21 695 82 80 https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics

EPFL Valais Wallis
EPFL SB ISIC-XRDSAP
Rue de l'Industrie 17
1951 Sion

+41 21 695 82 80
Office: CH H1 615
EPFL › SB › ISIC › ISIC-XRDSAP

Site web: https://www.epfl.ch/schools/sb/research/isic/platforms/x-ray-diffraction-and-surface-analytics/

+41 21 695 82 80
EPFL › VPA › VPA-AVP-DLE › AVP-DLE-EDOC › EDCH-ENS

+41 21 695 82 80
EPFL › VPA › VPA-AVP-DLE › AVP-DLE-EDOC › EDMX-ENS

Enseignement et PhD

Enseignement et PhD

Cours

Advanced Solid State and Surface Characterization

CH-633

Principles and Applications of X-ray Diffraction

CH-632