Former director of the Centre Interdisciplinaire de Microscopie Electronique (CIME) (1980-2007).
Associated editor of the European Physical Journal-Applied Physics (EPJAP) for microscopy, crystallography, nanosystems physics and nanomaterials.
President of the Programme committee of the French Electron Microscopy and Atom Probe net METSA (2009-2010).
Invited professor (2002-present) of the International Center for Electron Microscopy at the Material Advanced Testing and Computer Modeling of Metallurgical Process Faculty, AGH-University of Science and Technology, Krakow. Teaching analytical electron microscopy, research collaboration and application specialist of the Titan 60-300 (FEI) advanced transmission electron microscope.
Cooperation with the Institute of Crystallography of the Russian Academy of Science (ICRAS) and the Kurtchatov Research Institute in Moscow.
Born in Lausanne (Switzerland) in 1942. EPUL physics engineer diploma in 1967 and EPFL PhD in physics in 1976.
From 1966 he studies at the Experimental Physics Laboratory (Prof. J.P. Borel) the physical properties peculiar to the very small size metal crystals and gets a PhD degree for his thesis "Abaissement de la température de fusion de petits cristaux d'or par effet de taille thermodynamique" (Lowering of the melting temperature of small gold crystals by thermodynamic size effect. In 1971, he started to develop an electron microscopy facility available for all EPFL students and researchers. Since 1983, he manages the Centre interdépartemental de microscopie électronique (CIME).
His activity covers all the techniques related to transmission and scanning electron microscopy applied to materials science and solid state physics. His own interest is directed towards the structure of nanocrystals, their size effects and behaviour under strong electron irradiation, the phase transitions in perovskites, the characterisation of nanophases, multilayer and interface structures of crystalline materials and bioceramics.
He has been teaching electron microscopy for physics and materials science students and training users of the CIME.
He is past-president (2006-2007) of the Société Française des Microscopies (Sfµ), emeritus member of the Swiss Society of Optics and Microscopy (SSOM).
HRTEM, HRSTEM, WTEM, RTEM, SEM, EDS
- size effects
- e- irradiation
- phase identfication
- quantum wells
- interface abruptness and planeity
- nitridation, Ti-Ni-P
- phases structure+composition
- atom column EDS mapping