Philippe Buffat
Nationality: Swiss and French
EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne
Office: MXC 132
EPFL › VPA › VPA-AVP-CP › CIME › CIME-GE
Website: https://cime.epfl.ch
Expertise
HRTEM, HRSTEM, WTEM, RTEM, SEM, EDS
Nanodiffraction, precession
EDS microanalysis
Image simulation
Nanoparticles
- structure
- size effects
- e- irradiation
- phase identfication
Biominerals
- hydroxyapatite,Ca-P
III-V semiconductors
- quantum wells
- interface abruptness and planeity
Ti-base coatings
- nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition
- perovskites
Ni-base superalloys
- phases structure composition
- atom column EDS mapping
Phase identification in Mn-Si thermoelectrics
Swift ion irradiation defects in YBa2Cu3O7
Nanodiffraction, precession
EDS microanalysis
Image simulation
Nanoparticles
- structure
- size effects
- e- irradiation
- phase identfication
Biominerals
- hydroxyapatite,Ca-P
III-V semiconductors
- quantum wells
- interface abruptness and planeity
Ti-base coatings
- nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition
- perovskites
Ni-base superalloys
- phases structure composition
- atom column EDS mapping
Phase identification in Mn-Si thermoelectrics
Swift ion irradiation defects in YBa2Cu3O7
Expertise
HRTEM, HRSTEM, WTEM, RTEM, SEM, EDS
Nanodiffraction, precession
EDS microanalysis
Image simulation
Nanoparticles
- structure
- size effects
- e- irradiation
- phase identfication
Biominerals
- hydroxyapatite,Ca-P
III-V semiconductors
- quantum wells
- interface abruptness and planeity
Ti-base coatings
- nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition
- perovskites
Ni-base superalloys
- phases structure composition
- atom column EDS mapping
Phase identification in Mn-Si thermoelectrics
Swift ion irradiation defects in YBa2Cu3O7
Nanodiffraction, precession
EDS microanalysis
Image simulation
Nanoparticles
- structure
- size effects
- e- irradiation
- phase identfication
Biominerals
- hydroxyapatite,Ca-P
III-V semiconductors
- quantum wells
- interface abruptness and planeity
Ti-base coatings
- nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition
- perovskites
Ni-base superalloys
- phases structure composition
- atom column EDS mapping
Phase identification in Mn-Si thermoelectrics
Swift ion irradiation defects in YBa2Cu3O7
Current Work
Electron microscopy, of inorganic materials: recording experimental data, interpretation and image simulation.
Multilayered structures, free or embedded nano-particles, phase identification.
Multilayered structures, free or embedded nano-particles, phase identification.
Education
physique
| Solid state physics
1971 – 2025
Freelance electron microscopist. EM prof. EPFL.
Directed by
Freelance electron microscopist. EM prof. EPFL.