Philippe Buffat

EPFL CIME
MXC 132 (Bâtiment MXC)
Station 12
CH-1015 Lausanne
Web site: Site web: https://cime.epfl.ch
Domaines de compétences
HRTEM, HRSTEM, WTEM, RTEM, SEM, EDS
Nanodiffraction, precession
EDS microanalysis
HR(S)TEM/diffraction image simulation
Nanoparticles structure
- size effects, e- irradiation, phase identification
III-V semiconductors quantum wells
- interface abruptness and planeness
Ti-base coatings: nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition in perovskites
Ni-base superalloys: interfaces/composition
- atom column EDXS mapping
Mn-Si thermoelectrics phase distribution
YBCO swift ion irradiation defects
Biominerals: hydroxyapatite, Ca-P
Nanodiffraction, precession
EDS microanalysis
HR(S)TEM/diffraction image simulation
Nanoparticles structure
- size effects, e- irradiation, phase identification
III-V semiconductors quantum wells
- interface abruptness and planeness
Ti-base coatings: nitridation, Ti-Ni-P
CeO2/NLM precipitation
Phase transition in perovskites
Ni-base superalloys: interfaces/composition
- atom column EDXS mapping
Mn-Si thermoelectrics phase distribution
YBCO swift ion irradiation defects
Biominerals: hydroxyapatite, Ca-P